Your contact person
Adrian Bangerter
+41 62 285 80 13
This email address is being protected from spambots. You need JavaScript enabled to view it.
Microtester MCom - Fully automated test system for e-tests, functional tests, IC tests or high current tests
The microtester MCom is a fully automatic test system for double-sided testing of assembled and bare substrates. The substrates are fed from the stack, magazine, blister or inline from the conveyor belt. The visual recognition system PRS identifies and measures the substrate on both sides before it is positioned and offset-corrected in the fine-pitch adapter. Together with the Sirius-adapter technology, the MCom microtester enables the contacting of ≥ 40μm test points. Multiple applications are automatically stepped in the X and Y directions.
A quick-release system with identifiable interchangable kits ensures a safe and fast retooling. In addition, customer-specific options such as heating and cooling stations, cleaning processes or a visual devaluation of faulty substrates can be integrated.
The MCom adapter can be used for debugging the test program or for small series in the MCit-8.
MicroContact Microtester MCom (pdf)
Films
- Microtester for PCB and PCBA
- Microtester MCom with tray handling
- Functions Tester MCom
- Functions tester for thickfilm substrats
Your contact person
Adrian Bangerter
+41 62 285 80 13
This email address is being protected from spambots. You need JavaScript enabled to view it.
